ScholarWorks@Korea University

Browsing by Yeo, Kyoung HwanAuthor

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 2 to 2 of 2

SCISCIESCOPUS
Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model

Najam, Faraz; Yu, Yun Seop; Cho, Keun Hwi; Yeo, Kyoung Hwan; Kim, Dong-Won; Hwang, Jong Seung; Kim, Sansig; Hwang, Sung Woo

ArticleIssue Date2013CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.8, pp 2457 - 2463PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1
CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

145 Anam-ro, Seongbuk-gu, Seoul, 02841, Korea+82-2-3290-2963

COPYRIGHT © 2021 Korea University. All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어