Shim, Minseob; Jeong, Seokhyeon; Myers, Paul D.; Bang, Suyoung; Shen, Junhua; Kim, Chulwoo; Sylvester, Dennis; Blaauw, David; Jung, Wanyeong
ArticleIssue Date2017CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.4, pp.1077 - 1090PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC