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Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress

Kim, Hyojung; Kim, Soonkon; Yoo, Jongmin; Oh, Changyong; Kim, Bosung; Hwang, Hyuncheol; Park, Jungmin; Choi, Pyungho; Song, Jangkun; Im, Kiju, et al.

ArticleIssue Date2021CitationAIP ADVANCES, v.11, no.3PublisherAMER INST PHYSICS

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Effect of ALD- and PEALD- Grown Al2O3 Gate Insulators on Electrical and Stability Properties for a-IGZO Thin-Film Transistor

Park, Jungmin; Kim, Hyojung; Choi, Pyungho; Jeon, Bohyeon; Lee, Jongyoon; Oh, Changyong; Kim, Bosung; Choi, Byoungdeog

ArticleIssue Date2021CitationELECTRONIC MATERIALS LETTERS, v.17, no.4, pp.299 - 306PublisherKOREAN INST METALS MATERIALS

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Effects of polyimide curing on image sticking behaviors of flexible displays

Kim, Hyojung; Park, Jongwoo; Bak, Sora; Park, Jungmin; Byun, Changwoo; Oh, Changyong; Kim, Bo Sung; Han, Chanhee; Yoo, Jongmin; Kim, Dongbhin, et al.

ArticleIssue Date2021CitationSCIENTIFIC REPORTS, v.11, no.1PublisherNATURE PORTFOLIO

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