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Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors

Choi, Luryi; Hong, Byoung Hak; Jung, Young Chai; Cho, Keun Hwi; Yeo, Kyoung Hwan; Kim, Dong-Won; Jin, Gyo Young; Oh, Kyung Seok; Lee, Won-Seong; Song, Sang-Hun, et al.

ArticleIssue Date2009CitationIEEE ELECTRON DEVICE LETTERS, v.30, no.6, pp 665 - 667PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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