Yoo, Taegeun; Yeoh, Hong Chang; Jung, Yun-Hwan; Cho, Seong-Jin; Kim, Yong Sin; Kang, Sung-Mo; Baek, Kwang-Hyun
ArticleIssue Date2014CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.49, no.12, pp.2976 - 2989PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC