Abbaneo, D.; Abbrescia, M.; Ahmad, A.; Ahmed, W.; Ali, C.; Altieri, P. R.; Amr, M.; Asghar, I; Aspell, P.; Assran, Y., et al.
ArticleIssue Date2018CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.65, no.11, pp.2808 - 2816PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC