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High-speed dual-beam, crossed line-scanning fluorescence microscope with a point confocal resolution

Jeong, Hyun-Woo; Kim, Hyung-Jin; Eun, Jung; Heo, Seungjin; Lim, Mikyoung; Cho, Yong-Hoon; Kim, Beop-Min

ArticleIssue Date2015CitationAPPLIED OPTICS, v.54, no.12, pp.3811 - 3816PublisherOPTICAL SOC AMER
1
STATISTICS
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