Hahne, J. M.; Biessmann, F.; Jiang, N.; Rehbaum, H.; Farina, D.; Meinecke, F. C.; Mueller, K. -R.; Parra, L. C.
ArticleIssue Date2014CitationIEEE TRANSACTIONS ON NEURAL SYSTEMS AND REHABILITATION ENGINEERING, v.22, no.2, pp.269 - 279PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC