Mueller-Putz, Gernot; Leeb, Robert; Tangermann, Michael; Hoehne, Johannes; Kuebler, Andrea; Cincotti, Febo; Mattia, Donatella; Rupp, Ruediger; Mueller, Klaus-Robert; Millan, Jose del R.
ArticleIssue Date2015CitationPROCEEDINGS OF THE IEEE, v.103, no.6, pp.926 - 943PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC