Teh, F. C. E.; Lee, J-W; Zhu, K.; Brown, K. W.; Chajecki, Z.; Lynch, W. G.; Tsang, M. B.; Anthony, A.; Barney, J.; Dell'Aquila, D., et al.
ArticleIssue Date2021CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.68, no.8, pp.2294 - 2300PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
