Park, H.; Sim, J.; Choi, Y.; Choi, J.; Kwon, Y.; Park, S.; Park, G.; Chung, J.; Kim, K.; Jung, H., et al.
ArticleIssue Date2021CitationIEEE Journal of Solid-State Circuits, v.56, no.6, pp.1886 - 1896PublisherInstitute of Electrical and Electronics Engineers Inc.