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Investigating the effect of thermal annealing on dc performance of off-state drain-voltage step-stressed AlGaN/GaN high electron mobility transistors

Kim, Byung-Jae; Ahn, Shihyun; Hwang, Ya-Hsi; Ren, Fan; Pearton, Stephen J.; Kim, Jihyun; Zhang, Ming-Lan

ArticleIssue Date2015CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.33, no.3PublisherA V S AMER INST PHYSICS

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Recovery in dc and rf performance of off-state step-stressed AlGaN/GaN high electron mobility transistors with thermal annealing

Kim, Byung-Jae; Hwang, Ya-Hsi; Ahn, Shihyun; Zhu, Weidi; Dong, Chen; Lu, Liu; Ren, Fan; Holzworth, M. R.; Jones, Kevin S.; Pearton, Stephen J., et al.

ArticleIssue Date2015CitationAPPLIED PHYSICS LETTERS, v.106, no.15PublisherAMER INST PHYSICS

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