관리도 성능평가모형을 통한 관리한계선 갱신주기 탐지기법
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김종우 | - |
dc.contributor.author | 박정술 | - |
dc.contributor.author | 김준석 | - |
dc.contributor.author | 김성식 | - |
dc.contributor.author | 백준걸 | - |
dc.date.accessioned | 2021-09-05T15:03:00Z | - |
dc.date.available | 2021-09-05T15:03:00Z | - |
dc.date.created | 2021-06-17 | - |
dc.date.issued | 2014 | - |
dc.identifier.issn | 1225-0988 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/100488 | - |
dc.description.abstract | Statistical process control (SPC) is an important technique for monitoring and managing the manufacturing process. In spite of its easiness and effectiveness, some problematic sides of application exist such that the SPC techniques are hardly reflect the changes of the process conditions. Especially, update of control limits at the right time plays an important role in acquiring a reasonable performance of control charts. Therefore, we propose the control chart performance evaluation index (CPEI) based on count data model to monitor and manage the performance of control charts. The CPEI could indicate the degree of control chart performance and be helpful to detect the proper update cycle of control limits in real time. Experiments using real manufacturing data show that the proper update intervals are made by proposed method. | - |
dc.language | Korean | - |
dc.language.iso | ko | - |
dc.publisher | 대한산업공학회 | - |
dc.title | 관리도 성능평가모형을 통한 관리한계선 갱신주기 탐지기법 | - |
dc.title.alternative | Update Cycle Detection Method of Control Limits using Control Chart Performance Evaluation Model | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 백준걸 | - |
dc.identifier.doi | 10.7232/JKIIE.2014.40.1.043 | - |
dc.identifier.bibliographicCitation | 대한산업공학회지, v.40, no.1, pp.43 - 51 | - |
dc.relation.isPartOf | 대한산업공학회지 | - |
dc.citation.title | 대한산업공학회지 | - |
dc.citation.volume | 40 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 43 | - |
dc.citation.endPage | 51 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART001849057 | - |
dc.description.journalClass | 2 | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Control Chart | - |
dc.subject.keywordAuthor | Count Data Model | - |
dc.subject.keywordAuthor | Semiconductor Manufacturing Process | - |
dc.subject.keywordAuthor | Statistical Process Control | - |
dc.subject.keywordAuthor | Control Limit | - |
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