Characterizing Pb-based superconducting thin films
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, S.-I. | - |
dc.contributor.author | Kim, H.-S. | - |
dc.contributor.author | Lee, J.S. | - |
dc.contributor.author | Doh, Y.-J. | - |
dc.date.accessioned | 2021-09-05T16:03:13Z | - |
dc.date.available | 2021-09-05T16:03:13Z | - |
dc.date.created | 2021-06-17 | - |
dc.date.issued | 2014 | - |
dc.identifier.issn | 1229-3008 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/100765 | - |
dc.description.abstract | We report on the superconducting and structural characteristics of Pb-based alloy (Pb0.9In0.1, Pb0.8In0.2 and Pb0.85Bi0.15) thin films, depending on the film deposition rate. The maximum critical magnetic field strength of Pb0.85Bi0.15 is almost six times larger than that of Pb0.9In0.1, and more rapid growth of the film enhances the critical magnetic field strength even for the same alloy material. Scanning electron microscopy inspection indicates that lower deposition rate condition is vulnerable to the formation of void structure in the film. Topographic images using atomic force microscopy are useful to optimize the deposition condition for the growth of smooth superconducting film. Our work can be utilized for future studies on hybrid superconducting devices using low-dimensional nanostructures. © 2014 Korea Institute of Applied Superconductivity and Cryogenics. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | Korea Institute of Applied Superconductivity and Cryogenics | - |
dc.subject | Alloys | - |
dc.subject | Atomic force microscopy | - |
dc.subject | Deposition rates | - |
dc.subject | Film growth | - |
dc.subject | Lead | - |
dc.subject | Lead alloys | - |
dc.subject | Magnetic fields | - |
dc.subject | Scanning electron microscopy | - |
dc.subject | Strength of materials | - |
dc.subject | Superconducting devices | - |
dc.subject | Superconducting films | - |
dc.subject | Surface roughness | - |
dc.subject | Thin films | - |
dc.subject | Alloy materials | - |
dc.subject | Critical magnetic field | - |
dc.subject | Deposition conditions | - |
dc.subject | Film deposition rates | - |
dc.subject | Low dimensional nanostructures | - |
dc.subject | Structural characteristics | - |
dc.subject | Topographic images | - |
dc.subject | Void structures | - |
dc.subject | Deposition | - |
dc.title | Characterizing Pb-based superconducting thin films | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, J.S. | - |
dc.contributor.affiliatedAuthor | Doh, Y.-J. | - |
dc.identifier.doi | 10.9714/psac.2014.16.4.036 | - |
dc.identifier.scopusid | 2-s2.0-84920455487 | - |
dc.identifier.bibliographicCitation | Progress in Superconductivity and Cryogenics (PSAC), v.16, no.4, pp.36 - 39 | - |
dc.relation.isPartOf | Progress in Superconductivity and Cryogenics (PSAC) | - |
dc.citation.title | Progress in Superconductivity and Cryogenics (PSAC) | - |
dc.citation.volume | 16 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 36 | - |
dc.citation.endPage | 39 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART001948576 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordPlus | Atomic force microscopy | - |
dc.subject.keywordPlus | Deposition rates | - |
dc.subject.keywordPlus | Film growth | - |
dc.subject.keywordPlus | Lead | - |
dc.subject.keywordPlus | Lead alloys | - |
dc.subject.keywordPlus | Magnetic fields | - |
dc.subject.keywordPlus | Scanning electron microscopy | - |
dc.subject.keywordPlus | Strength of materials | - |
dc.subject.keywordPlus | Superconducting devices | - |
dc.subject.keywordPlus | Superconducting films | - |
dc.subject.keywordPlus | Surface roughness | - |
dc.subject.keywordPlus | Thin films | - |
dc.subject.keywordPlus | Alloy materials | - |
dc.subject.keywordPlus | Critical magnetic field | - |
dc.subject.keywordPlus | Deposition conditions | - |
dc.subject.keywordPlus | Film deposition rates | - |
dc.subject.keywordPlus | Low dimensional nanostructures | - |
dc.subject.keywordPlus | Structural characteristics | - |
dc.subject.keywordPlus | Topographic images | - |
dc.subject.keywordPlus | Void structures | - |
dc.subject.keywordPlus | Deposition | - |
dc.subject.keywordPlus | Alloys | - |
dc.subject.keywordAuthor | Critical magnetic field | - |
dc.subject.keywordAuthor | Deposition rate | - |
dc.subject.keywordAuthor | Pb-based alloys | - |
dc.subject.keywordAuthor | Roughness | - |
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