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Effect of fluorine plasma treatment with chemically reduced graphene oxide thin films as hole transport layer in organic solar cells

Authors
Yu, Youn-YeolKang, Byung HyunLee, Yang DooLee, Sang BinJu, Byeong-Kwon
Issue Date
15-12월-2013
Publisher
ELSEVIER
Keywords
Graphene oxide; Hole transport layer; Organic solar cells; Plasma treatments; Organic electronics
Citation
APPLIED SURFACE SCIENCE, v.287, pp.91 - 96
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
287
Start Page
91
End Page
96
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/101287
DOI
10.1016/j.apsusc.2013.09.078
ISSN
0169-4332
Abstract
The inorganic materials such as V2O5, MoO3 and WO3 were investigated to replace PEDOT:PSS as hole transport layer (HTL) in organic electronic devices such as organic solar cells (OSCs) and organic lighting emission diodes. However, these methods require vacuum techniques that are long time process and complex. Here, we report about plasma treatment with SF6 and CF4 using reactive ion etching on reduced graphene oxide (rGO) thin films that are obtained using an eco-friendly method with vitamin C. The plasma treated rGO thin films have dipoles since they consist of covalent bonds with fluorine on the surface of rGO. This means it is possible to increase the electrostatic potential energy than bare rGO. Increased potential energy on the surface of rGO films is worth applying organic electronic devices as HTL such as OSCs. Consequently, the power conversion efficiency of OSCs increased more than the rGO films without plasma treatment. (C) 2013 Elsevier B. V. All rights reserved.
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공과대학 (전기전자공학부)
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