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Digital calibration technique using a signed counter for charge pump mismatch in phase-locked loops

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dc.contributor.authorJeong, Chan-Hui-
dc.contributor.authorKim, Kyu-Young-
dc.contributor.authorKwon, Chan-Keun-
dc.contributor.authorKim, Hoonki-
dc.contributor.authorKim, Soo-Won-
dc.date.accessioned2021-09-05T19:40:32Z-
dc.date.available2021-09-05T19:40:32Z-
dc.date.created2021-06-15-
dc.date.issued2013-11-
dc.identifier.issn1751-858X-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/101739-
dc.description.abstractThe authors adopt a digital technique to calibrate the current mismatch of the charge pump in phase-locked loops. The proposed digital calibration technique using a signed counter reduces the calibration time up to a minimum of 64% as compared with the other techniques. This technique is designed by a standard 0.18 m CMOS technology. The calibration time is 32.8 s, the average power is 6.2 mW at a 1.8 V power supply and the effective area is 0.263 mm(2).-
dc.languageEnglish-
dc.language.isoen-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.subjectSPUR REDUCTION-
dc.subjectGLITCH-
dc.titleDigital calibration technique using a signed counter for charge pump mismatch in phase-locked loops-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Soo-Won-
dc.identifier.doi10.1049/iet-cds.2013.0011-
dc.identifier.scopusid2-s2.0-84890882621-
dc.identifier.wosid000328730900002-
dc.identifier.bibliographicCitationIET CIRCUITS DEVICES & SYSTEMS, v.7, no.6, pp.313 - 318-
dc.relation.isPartOfIET CIRCUITS DEVICES & SYSTEMS-
dc.citation.titleIET CIRCUITS DEVICES & SYSTEMS-
dc.citation.volume7-
dc.citation.number6-
dc.citation.startPage313-
dc.citation.endPage318-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusSPUR REDUCTION-
dc.subject.keywordPlusGLITCH-
dc.subject.keywordAuthorcalibration-
dc.subject.keywordAuthorCMOS digital integrated circuits-
dc.subject.keywordAuthordigital phase locked loops-
dc.subject.keywordAuthorcharge pump circuits-
dc.subject.keywordAuthordigital calibration technique-
dc.subject.keywordAuthorsigned counter-
dc.subject.keywordAuthorcharge pump mismatch-
dc.subject.keywordAuthorphase-locked loops-
dc.subject.keywordAuthorstandard CMOS technology-
dc.subject.keywordAuthorsize 0-
dc.subject.keywordAuthor18 mum-
dc.subject.keywordAuthortime 32-
dc.subject.keywordAuthor8 mus-
dc.subject.keywordAuthorpower 6-
dc.subject.keywordAuthor2 mW-
dc.subject.keywordAuthorvoltage 1-
dc.subject.keywordAuthor8 V-
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