A clustering algorithm-based control chart for inhomogeneously distributed TFT-LCD processes
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, Ji Hoon | - |
dc.contributor.author | Kim, Seoung Bum | - |
dc.date.accessioned | 2021-09-05T21:54:30Z | - |
dc.date.available | 2021-09-05T21:54:30Z | - |
dc.date.created | 2021-06-14 | - |
dc.date.issued | 2013-09-01 | - |
dc.identifier.issn | 0020-7543 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/102195 | - |
dc.description.abstract | Statistical process control techniques have been widely used to improve processes by reducing variations and defects. In the present paper, we propose a multivariate control chart technique based on a clustering algorithm that can effectively handle a situation in which the distribution of in-control observations is inhomogeneous. A simulation study was conducted to examine the characteristics of the proposed control chart and to compare them with Hotelling's T-2 multivariate control charts that are widely used in real-world processes. Moreover, an experiment with real data from the thin film transistor liquid crystal display (TFT-LCD) manufacturing process demonstrated the effectiveness and accuracy of the proposed control chart. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | TAYLOR & FRANCIS LTD | - |
dc.subject | STATISTICAL PROCESS-CONTROL | - |
dc.subject | DISTANCE | - |
dc.title | A clustering algorithm-based control chart for inhomogeneously distributed TFT-LCD processes | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Seoung Bum | - |
dc.identifier.doi | 10.1080/00207543.2013.793427 | - |
dc.identifier.scopusid | 2-s2.0-84884588459 | - |
dc.identifier.wosid | 000324088400019 | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.51, no.18, pp.5644 - 5657 | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH | - |
dc.citation.title | INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH | - |
dc.citation.volume | 51 | - |
dc.citation.number | 18 | - |
dc.citation.startPage | 5644 | - |
dc.citation.endPage | 5657 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Operations Research & Management Science | - |
dc.relation.journalWebOfScienceCategory | Engineering, Industrial | - |
dc.relation.journalWebOfScienceCategory | Engineering, Manufacturing | - |
dc.relation.journalWebOfScienceCategory | Operations Research & Management Science | - |
dc.subject.keywordPlus | STATISTICAL PROCESS-CONTROL | - |
dc.subject.keywordPlus | DISTANCE | - |
dc.subject.keywordAuthor | bootstrap | - |
dc.subject.keywordAuthor | clustering algorithm | - |
dc.subject.keywordAuthor | Hotelling&apos | - |
dc.subject.keywordAuthor | s T-2 | - |
dc.subject.keywordAuthor | multivariate control chart | - |
dc.subject.keywordAuthor | TFT-LCD | - |
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