Impact of proton irradiation on dc performance of AlGaN/GaN high electron mobility transistors
DC Field | Value | Language |
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dc.contributor.author | Liu, Lu | - |
dc.contributor.author | Cuervo, Camilo Velez | - |
dc.contributor.author | Xi, Yuyin | - |
dc.contributor.author | Ren, Fan | - |
dc.contributor.author | Pearton, Stephen J. | - |
dc.contributor.author | Kim, Hong-Yeol | - |
dc.contributor.author | Kim, Jihyun | - |
dc.contributor.author | Kravchenko, Ivan I. | - |
dc.date.accessioned | 2021-09-06T00:09:02Z | - |
dc.date.available | 2021-09-06T00:09:02Z | - |
dc.date.created | 2021-06-14 | - |
dc.date.issued | 2013-07 | - |
dc.identifier.issn | 1071-1023 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/102809 | - |
dc.description.abstract | The effects of high energy proton irradiation dose on dc performance as well as critical voltage of the drain-voltage step-stress of AlGaN/GaN high electron mobility transistors (HEMTs) were investigated to evaluate the feasibility of AlGaN/GaN HEMTs for space applications, which need to stand a variety of irradiations. The HEMTs were irradiated with protons at a fixed energy of 5 MeV and doses ranging from 10(9) to 2 X 10(14) cm(-2). For the dc characteristics, there was only minimal degradation of saturation drain current (I-DSS), transconductance (g(m)), electron mobility, and sheet carrier concentration at doses below 2 x 10(13) cm(-2), while the reduction of these parameters were 15%, 9%, 41% and 16.6%, respectively, at a dose of 2 x 10(14) cm(-2). At this same dose condition, increases of 37% in drain breakdown voltage (V-BR) and of 45% in critical voltage (V-cri) were observed. The improvements of drain breakdown voltage and critical voltage were attributed to the modification of the depletion region due to the introduction of a higher density of defects after irradiation at a higher dose. (C) 2013 American Vacuum Society. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | A V S AMER INST PHYSICS | - |
dc.subject | NATIVE DEFECTS | - |
dc.title | Impact of proton irradiation on dc performance of AlGaN/GaN high electron mobility transistors | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Jihyun | - |
dc.identifier.doi | 10.1116/1.4813785 | - |
dc.identifier.scopusid | 2-s2.0-84887430578 | - |
dc.identifier.wosid | 000322379800039 | - |
dc.identifier.bibliographicCitation | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.31, no.4 | - |
dc.relation.isPartOf | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | - |
dc.citation.title | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | - |
dc.citation.volume | 31 | - |
dc.citation.number | 4 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | NATIVE DEFECTS | - |
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