Sintering behavior and dielectric properties of KCa2Nb3O10 ceramics
DC Field | Value | Language |
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dc.contributor.author | Kweon, Sang-Hyo | - |
dc.contributor.author | Im, Mir | - |
dc.contributor.author | Han, Guifang | - |
dc.contributor.author | Kim, Jin-Seong | - |
dc.contributor.author | Nahm, Sahn | - |
dc.contributor.author | Choi, Ji-Won | - |
dc.contributor.author | Hwang, Seong-Ju | - |
dc.date.accessioned | 2021-09-06T01:50:32Z | - |
dc.date.available | 2021-09-06T01:50:32Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2013-05 | - |
dc.identifier.issn | 0955-2219 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/103314 | - |
dc.description.abstract | Dense KCa2Nb3O10 (KCN) oxides were synthesized and their dielectric properties were investigated. A homogeneous KCN phase was formed in the specimen sintered above 1300 degrees C, but a CaNb2O6 secondary phase was developed in the specimen sintered at 1400 degrees C, as result of the evaporation of K2O. The KCN oxides sintered at 1375 C showed a high relative density that was 97.1% of the theoretical density. Furthermore, liquid-phase-assisted abnormal grain growth occurred during sintering. The dielectric constant of this KCN oxide was 46, with a low dielectric loss of 0.9% at 100 kHz; these values are smaller than those that were previously reported. Complex impedance analysis indicated that the resistivity of the KCN oxide was very low, probably as a result of the presence of K+ ions between the layers, and this could be the origin of the low-frequency dispersion of the KCN oxides. (C) 2012 Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCI LTD | - |
dc.subject | (BA,SR)TIO3 THIN-FILMS | - |
dc.subject | DEPOSITION | - |
dc.subject | OXIDE | - |
dc.title | Sintering behavior and dielectric properties of KCa2Nb3O10 ceramics | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Nahm, Sahn | - |
dc.identifier.doi | 10.1016/j.jeurceramsoc.2012.11.017 | - |
dc.identifier.scopusid | 2-s2.0-84872340447 | - |
dc.identifier.wosid | 000314332600002 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, v.33, no.5, pp.907 - 911 | - |
dc.relation.isPartOf | JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | - |
dc.citation.title | JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | - |
dc.citation.volume | 33 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 907 | - |
dc.citation.endPage | 911 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.subject.keywordPlus | (BA,SR)TIO3 THIN-FILMS | - |
dc.subject.keywordPlus | DEPOSITION | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordAuthor | Dielectrics | - |
dc.subject.keywordAuthor | Layered perovskite | - |
dc.subject.keywordAuthor | Low loss | - |
dc.subject.keywordAuthor | Multilayer ceramic capacitor | - |
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