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Two-frequency interferometer for a displacement measurement
- Authors
- Yim, Sin Hyuk; Cho, D.; Park, Jouyon
- Issue Date
- 2월-2013
- Publisher
- AMER ASSOC PHYSICS TEACHERS AMER INST PHYSICS
- Keywords
- displacement measurement; Michelson interferometers; physics education; piezoelectric transducers
- Citation
- AMERICAN JOURNAL OF PHYSICS, v.81, no.2, pp.153 - 156
- Indexed
- SCIE
SCOPUS
- Journal Title
- AMERICAN JOURNAL OF PHYSICS
- Volume
- 81
- Number
- 2
- Start Page
- 153
- End Page
- 156
- ISSN
- 0002-9505
- Abstract
- We report on the construction of a two-frequency Michelson interferometer to measure small displacements based on the heterodyne principle. Unlike the common single-frequency interferometer, where relative displacements produce changes in output power, in the two-frequency device, displacements lead to phase shifts of the beating signal. The short- and long-term performance of the single- and two-frequency methods are compared. The heterodyne apparatus was also used to calibrate a piezoelectric transducer. (C) 2013 American Association of Physics Teachers. [http://dx.doi.org/10.1119/1.4746815]
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