다중 정상 하에서 단일 클래스 분류기법을 이용한 이상치 탐지 : TFT-LCD 공정 사례
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 주태우 | - |
dc.contributor.author | 김성범 | - |
dc.date.accessioned | 2021-09-06T09:16:37Z | - |
dc.date.available | 2021-09-06T09:16:37Z | - |
dc.date.created | 2021-06-17 | - |
dc.date.issued | 2013 | - |
dc.identifier.issn | 1225-0988 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/105715 | - |
dc.description.abstract | Novelty detection (ND) is an effective technique that can be used to determine whether a future observation is normal or not. In the present study we propose a novelty detection algorithm that can handle a situation where the distributions of target (normal) observations are inhomogeneous. A simulation study and a real case with the TFT-LCD process demonstrated the effectiveness and usefulness of the proposed algorithm. | - |
dc.language | Korean | - |
dc.language.iso | ko | - |
dc.publisher | 대한산업공학회 | - |
dc.title | 다중 정상 하에서 단일 클래스 분류기법을 이용한 이상치 탐지 : TFT-LCD 공정 사례 | - |
dc.title.alternative | A Novelty Detection Algorithm for Multiple Normal Classes : Application to TFT-LCD Processes | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 김성범 | - |
dc.identifier.doi | 10.7232/JKIIE.2013.39.2.082 | - |
dc.identifier.bibliographicCitation | 대한산업공학회지, v.39, no.2, pp.82 - 89 | - |
dc.relation.isPartOf | 대한산업공학회지 | - |
dc.citation.title | 대한산업공학회지 | - |
dc.citation.volume | 39 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 82 | - |
dc.citation.endPage | 89 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART001760420 | - |
dc.description.journalClass | 2 | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Novelty Detection | - |
dc.subject.keywordAuthor | Multiple Normal Classes | - |
dc.subject.keywordAuthor | Mahalanobis Distance | - |
dc.subject.keywordAuthor | Bootstrap Method | - |
dc.subject.keywordAuthor | Data Mining | - |
dc.subject.keywordAuthor | TFT-LCD Process | - |
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