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Engineering electronic properties of graphene by coupling with Si-Rich, two-dimensional Islands

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dc.contributor.authorLee, D.H.-
dc.contributor.authorYi, J.-
dc.contributor.authorLee, J.M.-
dc.contributor.authorLee, S.J.-
dc.contributor.authorDoh, Y.-J.-
dc.contributor.authorJeong, H.Y.-
dc.contributor.authorLee, Z.-
dc.contributor.authorPaik, U.-
dc.contributor.authorRogers, J.A.-
dc.contributor.authorPark, W.I.-
dc.date.accessioned2021-09-06T10:03:02Z-
dc.date.available2021-09-06T10:03:02Z-
dc.date.created2021-06-17-
dc.date.issued2013-
dc.identifier.issn1936-0851-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/105998-
dc.description.abstractRecent theoretical and experimental studies demonstrated that breaking of the sublattice symmetry in graphene produces an energy gap at the former Dirac point. We describe the synthesis of graphene sheets decorated with ultrathin, Si-rich two-dimensional (2D) islands (i.e., Gr:Si sheets), in which the electronic property of graphene is modulated by coupling with the Si-islands. Analyses based on transmission electron microscopy, atomic force microscopy, and electron and optical spectroscopies confirmed that Si-islands with thicknesses of ∼2 to 4 nm and a lateral size of several tens of nm were bonded to graphene via van der Waals interactions. Field-effect transistors (FETs) based on Gr:Si sheets exhibited enhanced transconductance and maximum-to-minimum current level compared to bare-graphene FETs, and their magnitudes gradually increased with increasing coverage of Si layers on the graphene. The temperature dependent current-voltage measurements of the Gr:Si sheet showed approximately a 2-fold increase in the resistance by decreasing the temperature from 250 to 10 K, which confirmed the opening of the substantial bandgap (∼2.5-3.2 meV) in graphene by coupling with Si islands. © 2012 American Chemical Society.-
dc.languageEnglish-
dc.language.isoen-
dc.subjectBand gap engineering-
dc.subjectCurrent levels-
dc.subjectCurrent-voltage measurements-
dc.subjectDirac point-
dc.subjectEnhanced transconductance-
dc.subjectExperimental studies-
dc.subjectGraphene sheets-
dc.subjectLateral sizes-
dc.subjectOptical spectroscopy-
dc.subjectSi layer-
dc.subjectSilicon islands-
dc.subjectSub-lattices-
dc.subjectSublattice symmetry-
dc.subjectTemperature dependent-
dc.subjectTwo-dimensional (2D) islands-
dc.subjectUltra-thin-
dc.subjectVan der waals-
dc.subjectVan Der Waals interactions-
dc.subjectAtomic force microscopy-
dc.subjectElectronic properties-
dc.subjectEnergy gap-
dc.subjectField effect transistors-
dc.subjectSilicon-
dc.subjectTransmission electron microscopy-
dc.subjectTwo dimensional-
dc.subjectVan der Waals forces-
dc.subjectGraphene-
dc.subjectgraphite-
dc.subjectnanomaterial-
dc.subjectsilicon-
dc.subjectarticle-
dc.subjectchemistry-
dc.subjectelectric conductivity-
dc.subjectequipment design-
dc.subjectequipment failure-
dc.subjectparticle size-
dc.subjectsemiconductor-
dc.subjectultrastructure-
dc.subjectElectric Conductivity-
dc.subjectEquipment Design-
dc.subjectEquipment Failure Analysis-
dc.subjectGraphite-
dc.subjectNanostructures-
dc.subjectParticle Size-
dc.subjectSilicon-
dc.subjectTransistors, Electronic-
dc.titleEngineering electronic properties of graphene by coupling with Si-Rich, two-dimensional Islands-
dc.typeArticle-
dc.contributor.affiliatedAuthorDoh, Y.-J.-
dc.identifier.doi10.1021/nn304007x-
dc.identifier.scopusid2-s2.0-84872830964-
dc.identifier.bibliographicCitationACS Nano, v.7, no.1, pp.301 - 307-
dc.relation.isPartOfACS Nano-
dc.citation.titleACS Nano-
dc.citation.volume7-
dc.citation.number1-
dc.citation.startPage301-
dc.citation.endPage307-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusBand gap engineering-
dc.subject.keywordPlusCurrent levels-
dc.subject.keywordPlusCurrent-voltage measurements-
dc.subject.keywordPlusDirac point-
dc.subject.keywordPlusEnhanced transconductance-
dc.subject.keywordPlusExperimental studies-
dc.subject.keywordPlusGraphene sheets-
dc.subject.keywordPlusLateral sizes-
dc.subject.keywordPlusOptical spectroscopy-
dc.subject.keywordPlusSi layer-
dc.subject.keywordPlusSilicon islands-
dc.subject.keywordPlusSub-lattices-
dc.subject.keywordPlusSublattice symmetry-
dc.subject.keywordPlusTemperature dependent-
dc.subject.keywordPlusTwo-dimensional (2D) islands-
dc.subject.keywordPlusUltra-thin-
dc.subject.keywordPlusVan der waals-
dc.subject.keywordPlusVan Der Waals interactions-
dc.subject.keywordPlusAtomic force microscopy-
dc.subject.keywordPlusElectronic properties-
dc.subject.keywordPlusEnergy gap-
dc.subject.keywordPlusField effect transistors-
dc.subject.keywordPlusSilicon-
dc.subject.keywordPlusTransmission electron microscopy-
dc.subject.keywordPlusTwo dimensional-
dc.subject.keywordPlusVan der Waals forces-
dc.subject.keywordPlusGraphene-
dc.subject.keywordPlusgraphite-
dc.subject.keywordPlusnanomaterial-
dc.subject.keywordPlussilicon-
dc.subject.keywordPlusarticle-
dc.subject.keywordPluschemistry-
dc.subject.keywordPluselectric conductivity-
dc.subject.keywordPlusequipment design-
dc.subject.keywordPlusequipment failure-
dc.subject.keywordPlusparticle size-
dc.subject.keywordPlussemiconductor-
dc.subject.keywordPlusultrastructure-
dc.subject.keywordPlusElectric Conductivity-
dc.subject.keywordPlusEquipment Design-
dc.subject.keywordPlusEquipment Failure Analysis-
dc.subject.keywordPlusGraphite-
dc.subject.keywordPlusNanostructures-
dc.subject.keywordPlusParticle Size-
dc.subject.keywordPlusSilicon-
dc.subject.keywordPlusTransistors, Electronic-
dc.subject.keywordAuthorbandgap engineering-
dc.subject.keywordAuthorgraphene-
dc.subject.keywordAuthorsilicon islands-
dc.subject.keywordAuthorsublattice asymmetry-
dc.subject.keywordAuthorvan der Waals growth-
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