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GaN-based light-emitting diodes by laser lift-off with micro- and nano-sized reflectors

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dc.contributor.authorJung, Younghun-
dc.contributor.authorKim, Sung Hyun-
dc.contributor.authorKim, Jihyun-
dc.contributor.authorWang, Xiaotie-
dc.contributor.authorRen, Fan-
dc.contributor.authorChoi, Kyoung Jin-
dc.contributor.authorPearton, Stephen J.-
dc.date.accessioned2021-09-06T16:03:57Z-
dc.date.available2021-09-06T16:03:57Z-
dc.date.created2021-06-18-
dc.date.issued2012-09-
dc.identifier.issn0734-2101-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/107570-
dc.description.abstractGaN-based light-emitting diodes (LEDs) were grown on a patterned sapphire substrate (PSS) containing hemispheres on the growth surface. Free-standing LED structures were obtained by removing the PSS using laser lift-off technique. The N-face GaN surface with micron-sized concave hemisphere structures, which had been located between the sapphire and the GaN film, was then exposed and photo-electrochemically etched using a 2M KOH solution to create nano-sized pyramids. Aluminum was deposited on the roughened N-face GaN as a reflective layer. The roughened aluminum reflectors, consisting of micron-sized hemisphere structures and nano-sized pyramids, enhanced the light extraction efficiency through multiple scattering events of photons and randomized the directions of the photons. The subsequent enhancement in electroluminescence was 13% compared with an untextured control LED. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4739769]-
dc.languageEnglish-
dc.language.isoen-
dc.publisherA V S AMER INST PHYSICS-
dc.subjectEXTRACTION EFFICIENCY-
dc.subjectQUANTUM EFFICIENCY-
dc.subjectGALLIUM NITRIDE-
dc.subjectSURFACE-
dc.subjectLAYER-
dc.subjectPOLAR-
dc.titleGaN-based light-emitting diodes by laser lift-off with micro- and nano-sized reflectors-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Sung Hyun-
dc.contributor.affiliatedAuthorKim, Jihyun-
dc.identifier.doi10.1116/1.4739769-
dc.identifier.scopusid2-s2.0-84865480866-
dc.identifier.wosid000308404900005-
dc.identifier.bibliographicCitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.30, no.5-
dc.relation.isPartOfJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.citation.titleJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.citation.volume30-
dc.citation.number5-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusEXTRACTION EFFICIENCY-
dc.subject.keywordPlusQUANTUM EFFICIENCY-
dc.subject.keywordPlusGALLIUM NITRIDE-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusLAYER-
dc.subject.keywordPlusPOLAR-
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