Modification of the optical properties of ZnO thin films by proton implantation
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ham, Yong Ju | - |
dc.contributor.author | Park, Jun Kue | - |
dc.contributor.author | Lee, W. | - |
dc.contributor.author | Lee, Cheol Eui | - |
dc.contributor.author | Park, W. | - |
dc.date.accessioned | 2021-09-06T16:20:41Z | - |
dc.date.available | 2021-09-06T16:20:41Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2012-09 | - |
dc.identifier.issn | 0025-5408 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107668 | - |
dc.description.abstract | Optical properties of proton-implanted ZnO thin film prepared by radio-frequency (rf) magneton sputtering have been studied, the optical constants being obtained from the reflectance measurements by employing Cauchy-Urbach model. Increase in the ordinary refractive index after proton implantation was explained by that in the polarizability. Besides, a slight increase in the optical band gap by proton implantation was identified and discussed in terms of the hydrogen shallow donors introduced by the proton implantation. (C) 2012 Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.subject | ZINC-OXIDE | - |
dc.subject | SPECTROSCOPIC ELLIPSOMETRY | - |
dc.subject | REFRACTIVE-INDEX | - |
dc.subject | LAYER | - |
dc.subject | SUBSTRATE | - |
dc.subject | INCREASE | - |
dc.subject | HYDROGEN | - |
dc.subject | SILICON | - |
dc.title | Modification of the optical properties of ZnO thin films by proton implantation | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Cheol Eui | - |
dc.identifier.doi | 10.1016/j.materresbull.2012.05.029 | - |
dc.identifier.scopusid | 2-s2.0-84864631862 | - |
dc.identifier.wosid | 000309081400045 | - |
dc.identifier.bibliographicCitation | MATERIALS RESEARCH BULLETIN, v.47, no.9, pp.2403 - 2406 | - |
dc.relation.isPartOf | MATERIALS RESEARCH BULLETIN | - |
dc.citation.title | MATERIALS RESEARCH BULLETIN | - |
dc.citation.volume | 47 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 2403 | - |
dc.citation.endPage | 2406 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.subject.keywordPlus | ZINC-OXIDE | - |
dc.subject.keywordPlus | SPECTROSCOPIC ELLIPSOMETRY | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordPlus | SUBSTRATE | - |
dc.subject.keywordPlus | INCREASE | - |
dc.subject.keywordPlus | HYDROGEN | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordAuthor | ZnO film | - |
dc.subject.keywordAuthor | Proton implantation | - |
dc.subject.keywordAuthor | Optical properties | - |
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