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A new method for evaluating postacne scarring
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jin Woong | - |
| dc.contributor.author | Kim, Beom Joon | - |
| dc.contributor.author | Kim, Myeung Nam | - |
| dc.contributor.author | Choi, Young-Hwan | - |
| dc.contributor.author | Kim, Kyungrok | - |
| dc.contributor.author | Hwang, Eenjun | - |
| dc.date.accessioned | 2021-09-06T17:31:31Z | - |
| dc.date.available | 2021-09-06T17:31:31Z | - |
| dc.date.created | 2021-06-18 | - |
| dc.date.issued | 2012-08 | - |
| dc.identifier.issn | 0909-752X | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107903 | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | WILEY-BLACKWELL | - |
| dc.title | A new method for evaluating postacne scarring | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Hwang, Eenjun | - |
| dc.identifier.doi | 10.1111/j.1600-0846.2011.00568.x | - |
| dc.identifier.scopusid | 2-s2.0-84863557345 | - |
| dc.identifier.wosid | 000306012700017 | - |
| dc.identifier.bibliographicCitation | SKIN RESEARCH AND TECHNOLOGY, v.18, no.3, pp.384 - 385 | - |
| dc.relation.isPartOf | SKIN RESEARCH AND TECHNOLOGY | - |
| dc.citation.title | SKIN RESEARCH AND TECHNOLOGY | - |
| dc.citation.volume | 18 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 384 | - |
| dc.citation.endPage | 385 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Letter | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Dermatology | - |
| dc.relation.journalWebOfScienceCategory | Dermatology | - |
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Related Researcher
- Hwang, Een jun
- College of Engineering (School of Electrical Engineering)