Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Meyer, Jannik C. | - |
dc.contributor.author | Eder, Franz | - |
dc.contributor.author | Kurasch, Simon | - |
dc.contributor.author | Skakalova, Viera | - |
dc.contributor.author | Kotakoski, Jani | - |
dc.contributor.author | Park, Hye Jin | - |
dc.contributor.author | Roth, Siegmar | - |
dc.contributor.author | Chuvilin, Andrey | - |
dc.contributor.author | Eyhusen, Soeren | - |
dc.contributor.author | Benner, Gerd | - |
dc.contributor.author | Krasheninnikov, Arkady V. | - |
dc.contributor.author | Kaiser, Ute | - |
dc.date.accessioned | 2021-09-06T19:56:11Z | - |
dc.date.available | 2021-09-06T19:56:11Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2012-05-07 | - |
dc.identifier.issn | 0031-9007 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/108444 | - |
dc.description.abstract | We present an accurate measurement and a quantitative analysis of electron-beam-induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displacement ("knock-on'') cross section by counting the lost atoms as a function of the electron-beam energy and applied dose. Further, we separate knock-on damage (originating from the collision of the beam electrons with the nucleus of the target atom) from other radiation damage mechanisms (e.g., ionization damage or chemical etching) by the comparison of ordinary (C-12) and heavy (C-13) graphene. Our analysis shows that a static lattice approximation is not sufficient to describe knock-on damage in this material, while a very good agreement between calculated and experimental cross sections is obtained if lattice vibrations are taken into account. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER PHYSICAL SOC | - |
dc.subject | ENERGY-LOSS SPECTROSCOPY | - |
dc.subject | TEMPERATURE-DEPENDENCE | - |
dc.subject | THRESHOLD ENERGY | - |
dc.subject | CARBON NANOTUBES | - |
dc.subject | IRRADIATION | - |
dc.subject | STABILITY | - |
dc.subject | DAMAGE | - |
dc.subject | MICROSCOPY | - |
dc.subject | ATOMS | - |
dc.title | Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Roth, Siegmar | - |
dc.identifier.doi | 10.1103/PhysRevLett.108.196102 | - |
dc.identifier.scopusid | 2-s2.0-84860717107 | - |
dc.identifier.wosid | 000303662500013 | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW LETTERS, v.108, no.19 | - |
dc.relation.isPartOf | PHYSICAL REVIEW LETTERS | - |
dc.citation.title | PHYSICAL REVIEW LETTERS | - |
dc.citation.volume | 108 | - |
dc.citation.number | 19 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.subject.keywordPlus | ENERGY-LOSS SPECTROSCOPY | - |
dc.subject.keywordPlus | TEMPERATURE-DEPENDENCE | - |
dc.subject.keywordPlus | THRESHOLD ENERGY | - |
dc.subject.keywordPlus | CARBON NANOTUBES | - |
dc.subject.keywordPlus | IRRADIATION | - |
dc.subject.keywordPlus | STABILITY | - |
dc.subject.keywordPlus | DAMAGE | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | ATOMS | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.