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Effect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance

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dc.contributor.authorJoo, Sungjung-
dc.contributor.authorJung, K. Y.-
dc.contributor.authorLee, B. C.-
dc.contributor.authorKim, Tae-Suk-
dc.contributor.authorShin, K. H.-
dc.contributor.authorJung, Myung-Hwa-
dc.contributor.authorRho, K-J.-
dc.contributor.authorPark, J. -H.-
dc.contributor.authorHong, Jinki-
dc.contributor.authorRhie, K.-
dc.date.accessioned2021-09-06T21:11:12Z-
dc.date.available2021-09-06T21:11:12Z-
dc.date.created2021-06-18-
dc.date.issued2012-04-23-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/108704-
dc.description.abstractThe ferromagnetic layer in magnetic tunnel junctions (MTJs) was oxidized with varying O-2 concentrations, and the corresponding effect on spin-dependent transport was studied. As expected from our previous results for MTJs with an over-oxidized AlOx tunnel barrier, a partially oxidized ferromagnetic layer plays an important role in spin-dependent transport. As the temperature is lowered, the junction resistance increases dramatically, and the tunneling magnetoresistance (TMR) is strongly suppressed. Increasing the O-2 concentration enhances the increase of resistance and suppression of TMR. This work supports our previous conclusion that oxidizing the ferromagnetic layer generates localized magnetic moments, which act as a scattering center for spin-polarized tunneling electrons. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704557]-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER INST PHYSICS-
dc.subjectEXCHANGE MODEL-
dc.subjectANOMALIES-
dc.subjectSTATES-
dc.subjectTRANSISTOR-
dc.subjectDEPENDENCE-
dc.titleEffect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance-
dc.typeArticle-
dc.contributor.affiliatedAuthorHong, Jinki-
dc.contributor.affiliatedAuthorRhie, K.-
dc.identifier.doi10.1063/1.4704557-
dc.identifier.scopusid2-s2.0-84860318539-
dc.identifier.wosid000303340300050-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.100, no.17-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume100-
dc.citation.number17-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusEXCHANGE MODEL-
dc.subject.keywordPlusANOMALIES-
dc.subject.keywordPlusSTATES-
dc.subject.keywordPlusTRANSISTOR-
dc.subject.keywordPlusDEPENDENCE-
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과학기술대학 (디스플레이·반도체물리학부 반도체물리전공)
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