Fabrication of a Polyurethane Acrylate/Polyimide-Based Polymer Mold for a Hot Embossing Process
DC Field | Value | Language |
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dc.contributor.author | Kim, Kang-In | - |
dc.contributor.author | Han, Kang-Soo | - |
dc.contributor.author | Yang, Ki-Yeon | - |
dc.contributor.author | Kim, Hyeong-Seok | - |
dc.contributor.author | Lee, Heon | - |
dc.date.accessioned | 2021-09-06T21:51:41Z | - |
dc.date.available | 2021-09-06T21:51:41Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2012-04 | - |
dc.identifier.issn | 1533-4880 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/108866 | - |
dc.description.abstract | A high-thermal-resistance polymer-based flexible imprint mold was developed to be used in a hot embossing process. This mold was readily replicated in a UV curing imprint process and can be used as a mold for hot embossing and thermally curing imprint processes. The nano-sized pattern of this mold was not degraded by soaking at 350 degrees C for 10 min and the pattern fidelity was maintained after 10 separate cyclic heating tests between 0 degrees C and 350 degrees C. The substrate of this flexible mold was PI film, and a UV-cured polyurethane acrylate (PUA) layer was used to form the nano-scale patterns. The durability of this polymeric mold was tested by repetitive hot embossing processes. Nano-scale patterns of the mold were readily transferred to a PMMA layer coated onto a Si substrate by hot embossing lithography at 180 degrees C. After 10 cycles of hot embossing processes, no damage or degradation was observed in the flexible polymer mold. Using this polymer mold, patterns as small as 50 nm were successfully transferred to a Si substrate. Due to the flexibility of the polymer mold, nano-scale patterns were successfully transferred to a non-flat acryl substrate by hot embossing lithography. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER SCIENTIFIC PUBLISHERS | - |
dc.subject | NANOIMPRINT LITHOGRAPHY | - |
dc.subject | RESOLUTION | - |
dc.subject | TEMPLATE | - |
dc.subject | IMPRINT | - |
dc.subject | LAYER | - |
dc.title | Fabrication of a Polyurethane Acrylate/Polyimide-Based Polymer Mold for a Hot Embossing Process | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Heon | - |
dc.identifier.doi | 10.1166/jnn.2012.5612 | - |
dc.identifier.wosid | 000305850900087 | - |
dc.identifier.bibliographicCitation | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.12, no.4, pp.3417 - 3420 | - |
dc.relation.isPartOf | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.citation.title | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.citation.volume | 12 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 3417 | - |
dc.citation.endPage | 3420 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | NANOIMPRINT LITHOGRAPHY | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.subject.keywordPlus | TEMPLATE | - |
dc.subject.keywordPlus | IMPRINT | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordAuthor | Nano-Imprint Lithography | - |
dc.subject.keywordAuthor | PUA | - |
dc.subject.keywordAuthor | PI | - |
dc.subject.keywordAuthor | Non-Flat Substrate | - |
dc.subject.keywordAuthor | Flexible Mold | - |
dc.subject.keywordAuthor | Hot Embossing | - |
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