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An Efficient Ray Tracing Algorithm for the Simulation of Light Trapping Effects in Si Solar Cells With Textured Surfaces

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dc.contributor.authorByun, Seok Yong-
dc.contributor.authorByun, Seok-Joo-
dc.contributor.authorLee, Jang Kyo-
dc.contributor.authorKim, Jae Wan-
dc.contributor.authorLee, Taek Sung-
dc.contributor.authorSheen, Dongwoo-
dc.contributor.authorCho, Kyuman-
dc.contributor.authorTark, Sung Ju-
dc.contributor.authorKim, Donghwan-
dc.contributor.authorKim, Won Mok-
dc.date.accessioned2021-09-06T21:52:32Z-
dc.date.available2021-09-06T21:52:32Z-
dc.date.created2021-06-18-
dc.date.issued2012-04-
dc.identifier.issn1533-4880-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/108871-
dc.description.abstractOptimizing the design of the surface texture is an essential aspect of Si solar cell technology as it can maximize the light trapping efficiency of the cells. The proper simulation tools can provide efficient means of designing and analyzing the effects of the texture patterns on light confinement in an active medium. In this work, a newly devised algorithm termed Slab-Outline, based on a ray tracing technique, is reported. The details of the intersection searching logic adopted in Slab-Outline algorithm are also discussed. The efficiency of the logic was tested by comparing the computing time between the current algorithm and the Constructive Solid Geometry algorithm, and its superiority in computing speed was proved. The validity of the new algorithm was verified by comparing the simulated reflectance spectra with the measured spectra from a textured Si surface.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.subjectTREES-
dc.titleAn Efficient Ray Tracing Algorithm for the Simulation of Light Trapping Effects in Si Solar Cells With Textured Surfaces-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Donghwan-
dc.identifier.doi10.1166/jnn.2012.5559-
dc.identifier.wosid000305850900044-
dc.identifier.bibliographicCitationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.12, no.4, pp.3224 - 3227-
dc.relation.isPartOfJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.titleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.volume12-
dc.citation.number4-
dc.citation.startPage3224-
dc.citation.endPage3227-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusTREES-
dc.subject.keywordAuthorRay Tracing-
dc.subject.keywordAuthorLight Confinement-
dc.subject.keywordAuthorTexturing-
dc.subject.keywordAuthorSi Solar Cells-
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