Attenuation of propagating spin wave induced by layered nanostructures
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sekiguchi, K. | - |
dc.contributor.author | Vader, T. N. | - |
dc.contributor.author | Yamada, K. | - |
dc.contributor.author | Fukami, S. | - |
dc.contributor.author | Ishiwata, N. | - |
dc.contributor.author | Seo, S. M. | - |
dc.contributor.author | Lee, S. W. | - |
dc.contributor.author | Lee, K. J. | - |
dc.contributor.author | Ono, T. | - |
dc.date.accessioned | 2021-09-06T22:13:45Z | - |
dc.date.available | 2021-09-06T22:13:45Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2012-03-26 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/108965 | - |
dc.description.abstract | Spin wave attenuation in the layered left perpendicularFeNi/Ptright perpendicular(6)/FeNi thin films was investigated by the time-domain electrical measurement. The spin-wave waveform was detected with an asymmetric coplanar strip transmission line, as an induced voltage flowing into a fast oscilloscope. We report that the amplitude of a spin-wave packet was systematically changed by controlling the thickness of a platinum layer, up to a maximum change of 50%. The virtues of spin wave, ultrafast propagation velocity and non-reciprocal emission, are preserved in this manner. This means that the Pt layer can manipulate an arbitral power-level of spin-wave input signal (reliable attenuator). (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3699020] | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | FERROMAGNETIC-RESONANCE LINEWIDTH | - |
dc.subject | FILMS | - |
dc.subject | TA | - |
dc.subject | NM | - |
dc.subject | CU | - |
dc.title | Attenuation of propagating spin wave induced by layered nanostructures | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, K. J. | - |
dc.identifier.doi | 10.1063/1.3699020 | - |
dc.identifier.scopusid | 2-s2.0-84859518725 | - |
dc.identifier.wosid | 000302230800047 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.100, no.13 | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 100 | - |
dc.citation.number | 13 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | FERROMAGNETIC-RESONANCE LINEWIDTH | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | TA | - |
dc.subject.keywordPlus | NM | - |
dc.subject.keywordPlus | CU | - |
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