Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

앙상블 학습을 이용한 DRAM 모듈 출하 품질보증 검사 불량 예측

Full metadata record
DC Field Value Language
dc.contributor.author김민석-
dc.contributor.author백준걸-
dc.date.accessioned2021-09-07T02:50:16Z-
dc.date.available2021-09-07T02:50:16Z-
dc.date.created2021-06-17-
dc.date.issued2012-
dc.identifier.issn1225-0996-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/110226-
dc.description.abstractThe DRAM module is an important part of servers, workstations and personal computer. Its malfunction causes a lot of damage on customer system. Therefore, customers demand the highest quality products. The company applies DRAM module Outgoing Quality Assurance Inspection(OQA) to secures the highest quality. It is the key process to decides shipment of products through sample inspection method with customer oriented tests. High fraction of defectives entering to OQA causes inevitable high quality cost. This article proposes the application of ensemble learning to classify the lot status to minimize the ratio of wrong decision in OQA, observing a potential in reducing the wrong decision.-
dc.languageKorean-
dc.language.isoko-
dc.publisher대한산업공학회-
dc.title앙상블 학습을 이용한 DRAM 모듈 출하 품질보증 검사 불량 예측-
dc.title.alternativeFail Prediction of DRAM Module Outgoing Quality Assurance Inspection using Ensemble Learning Algorithm-
dc.typeArticle-
dc.contributor.affiliatedAuthor백준걸-
dc.identifier.bibliographicCitation산업공학(IE interfaces), v.25, no.2, pp.178 - 186-
dc.relation.isPartOf산업공학(IE interfaces)-
dc.citation.title산업공학(IE interfaces)-
dc.citation.volume25-
dc.citation.number2-
dc.citation.startPage178-
dc.citation.endPage186-
dc.type.rimsART-
dc.identifier.kciidART001664330-
dc.description.journalClass2-
dc.description.journalRegisteredClasskci-
dc.subject.keywordAuthordecision tree(C4.5)-
dc.subject.keywordAuthorensemble learning-
dc.subject.keywordAuthorsemiconductor manufacturing-
dc.subject.keywordAuthorDRAM module-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Industrial and Management Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Baek, Jun Geol photo

Baek, Jun Geol
College of Engineering (School of Industrial and Management Engineering)
Read more

Altmetrics

Total Views & Downloads

BROWSE