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Enhancement of measurement sensitivity of polarization holographic microscopy

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dc.contributor.authorKim, Beop-Min-
dc.date.accessioned2021-08-27T15:42:57Z-
dc.date.available2021-08-27T15:42:57Z-
dc.date.created2021-04-22-
dc.date.issued2019-07-15-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/11083-
dc.publisher한국광학회-
dc.titleEnhancement of measurement sensitivity of polarization holographic microscopy-
dc.title.alternativeEnhancement of measurement sensitivity of polarization holographic microscopy-
dc.typeConference-
dc.contributor.affiliatedAuthorKim, Beop-Min-
dc.identifier.bibliographicCitationThe 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019-
dc.relation.isPartOfThe 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019-
dc.relation.isPartOfThe 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019-
dc.citation.titleThe 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2019-07-14-
dc.type.rimsCONF-
dc.description.journalClass2-
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