Surface potential behaviors of UV treated of Ag anode for high-performance T-OLED by nanotribology
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Soo In | - |
dc.contributor.author | Oh, Hwan Won | - |
dc.contributor.author | Huh, Jin Woo | - |
dc.contributor.author | Ju, ByeongKwon | - |
dc.contributor.author | Lee, Chang Woo | - |
dc.date.accessioned | 2021-09-07T09:42:06Z | - |
dc.date.available | 2021-09-07T09:42:06Z | - |
dc.date.created | 2021-06-19 | - |
dc.date.issued | 2011-08-01 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/111823 | - |
dc.description.abstract | A high reflective bottom anode is essential for high-performance top-emitting organic light emitting devices (OLEDs). Ag has high reflectivity for visible light but its electronic properties are not ideal for anodes of OLEDs. Thus, we investigated the UV treatment effect of Ag film with a thin silver oxide layer at the surface for application of top-emitting OLEDs. In this study, we measured the change of potential difference between Ag film and ITO (indium tin oxide) films, according to UV treatment time and the mechanical properties by KPFM (Kelvin Probe Force Microscope) method and nano-indenter system, respectively. The KPFM and nano-indenter results show that the differences of surface potential and surface volume change according to UV treatment time. (C) 2011 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | PROBE FORCE MICROSCOPY | - |
dc.subject | DEVICES | - |
dc.title | Surface potential behaviors of UV treated of Ag anode for high-performance T-OLED by nanotribology | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Ju, ByeongKwon | - |
dc.identifier.doi | 10.1016/j.tsf.2011.04.046 | - |
dc.identifier.wosid | 000294790900051 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.519, no.20, pp.6872 - 6875 | - |
dc.relation.isPartOf | THIN SOLID FILMS | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 519 | - |
dc.citation.number | 20 | - |
dc.citation.startPage | 6872 | - |
dc.citation.endPage | 6875 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | PROBE FORCE MICROSCOPY | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordAuthor | Ag anode | - |
dc.subject.keywordAuthor | Work function | - |
dc.subject.keywordAuthor | Indium tin oxide (ITO) | - |
dc.subject.keywordAuthor | UV treatment | - |
dc.subject.keywordAuthor | OLED | - |
dc.subject.keywordAuthor | KPFM (Kelvin Probe Force Microscope) | - |
dc.subject.keywordAuthor | Nano-indenter | - |
dc.subject.keywordAuthor | Nanotribology | - |
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