Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Aluminum Nanotransmission Lines with No Grain Boundaries and No Surface Roughness

Full metadata record
DC Field Value Language
dc.contributor.authorKang, Myunggil-
dc.contributor.authorLee, Jongwoon-
dc.contributor.authorHwang, Donghoon-
dc.contributor.authorKim, Byung-Sung-
dc.contributor.authorHong, Byunghak-
dc.contributor.authorWhang, Dongmok-
dc.contributor.authorHwang, Sungwoo-
dc.date.accessioned2021-09-07T11:56:21Z-
dc.date.available2021-09-07T11:56:21Z-
dc.date.created2021-06-14-
dc.date.issued2011-06-
dc.identifier.issn1882-0778-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/112306-
dc.description.abstractIdeal metallic interconnects and transmission lines should be free of grain boundaries and surface roughness. In this study, we demonstrated microwave transmission through transmission lines fabricated from single-crystalline aluminum nanowires (AlNWs) with no surface roughness and no grain boundaries. These nanotransmission lines showed an intrinsic loss of 3 dB at the frequency of 140 GHz. The extracted parameters from the measured microwave data exhibited resistance values consistent with the ideal DC resistivity of pure aluminum. (C) 2011 The Japan Society of Applied Physics-
dc.languageEnglish-
dc.language.isoen-
dc.publisherJAPAN SOC APPLIED PHYSICS-
dc.titleAluminum Nanotransmission Lines with No Grain Boundaries and No Surface Roughness-
dc.typeArticle-
dc.contributor.affiliatedAuthorHwang, Sungwoo-
dc.identifier.doi10.1143/APEX.4.064104-
dc.identifier.scopusid2-s2.0-79958823877-
dc.identifier.wosid000291479300031-
dc.identifier.bibliographicCitationAPPLIED PHYSICS EXPRESS, v.4, no.6-
dc.relation.isPartOfAPPLIED PHYSICS EXPRESS-
dc.citation.titleAPPLIED PHYSICS EXPRESS-
dc.citation.volume4-
dc.citation.number6-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE