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dc.contributor.authorChung, Sung Woo-
dc.date.accessioned2021-09-07T13:06:52Z-
dc.date.available2021-09-07T13:06:52Z-
dc.date.created2021-06-14-
dc.date.issued2011-04-28-
dc.identifier.issn0013-5194-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/112627-
dc.languageEnglish-
dc.language.isoen-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.titleinterview-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Sung Woo-
dc.identifier.doi10.1049/el.2011.9038-
dc.identifier.wosid000289938800001-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.47, no.9, pp.524 - 524-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume47-
dc.citation.number9-
dc.citation.startPage524-
dc.citation.endPage524-
dc.type.rimsART-
dc.type.docTypeEditorial Material-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
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