Single-shot Full-field reflection phase microscopy
- Authors
- Yaqoob, Zahid; Yamauchi, Toyohiko; Choi, Wonshik; Fu, Dan; Dasari, Ramachandra R.; Feld, Michael S.
- Issue Date
- 11-4월-2011
- Publisher
- OPTICAL SOC AMER
- Citation
- OPTICS EXPRESS, v.19, no.8, pp.7587 - 7595
- Indexed
- SCIE
SCOPUS
- Journal Title
- OPTICS EXPRESS
- Volume
- 19
- Number
- 8
- Start Page
- 7587
- End Page
- 7595
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/112669
- DOI
- 10.1364/OE.19.007587
- ISSN
- 1094-4087
- Abstract
- We present a full-field reflection phase microscope that combines low-coherence interferometry and off-axis digital holographic microscopy (DHM). The reflection-based DHM provides highly sensitive and a single-shot imaging of cellular dynamics while the use of low coherence source provides a depth-selective measurement. The setup uniquely uses a diffraction grating in the reference arm to generate an interference image of uniform contrast over the entire field-of-view albeit low-coherence light source. We have measured the path-length sensitivity of our instrument to be approximately 21 picometers/root Hz that makes it suitable for nanometer-scale full-field measurement of membrane dynamics in live cells. (C) 2011 Optical Society of America
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Collections - College of Science > Department of Physics > 1. Journal Articles
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