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Optical Study of Mn-Doped Bi4Ti3O12 Thin Films by Spectroscopic Ellipsometry

Authors
Hwang, Soon YongKim, Tae JungYoon, Jae JinCha, Young HunKim, Young DongSeong, Tae-GeunKang, Lee-SeungNahm, Sahn
Issue Date
1월-2011
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Ellipsometry; Bi4Ti3O12; Mn-Doped; Tauc-Lorentz Dispersion Relation
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.1, pp.884 - 888
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
11
Number
1
Start Page
884
End Page
888
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/113307
DOI
10.1166/jnn.2011.3261
ISSN
1533-4880
Abstract
Mn-doped Bi4Ti3O12(B4T3) thin films grown at 400 degrees C on a Pt/Ti/SiO2/Si substrate through pulsed laser deposition (PLD) were analyzed via spectroscopic ellipsometry (SE). The PLD targets were produced through the conventional solid-state sintering method, and the film samples were annealed at 600 degrees C. The SE spectra of B4T3 films were measured using a rotating analyzer type ellipsometer within the 1.12 to 6.52 eV energy range, with the various incidence angles. The optical properties of the B4T3 films with increasing Mn-mol concentration were extracted using a multilayer model for the whole structure and the Tauc-Lorentz (TL) dispersion relation for the B4T3 film layer. The analysis results clearly showed that the significant changes in optical properties of B4T3 films are caused by thermal annealing procedure and the Mn-mol concentrations. X-ray diffraction (XRD) measurement was also performed to confirm the results of SE analysis.
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