Investigation of the Cause of a Malfunction in a Display Package and Its Solution
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jae Choon | - |
dc.contributor.author | Lee, Dong Jin | - |
dc.contributor.author | Hwang, Sung Woo | - |
dc.contributor.author | Ju, Byeong-Kwon | - |
dc.contributor.author | Yun, Sang Kyeong | - |
dc.contributor.author | Park, Heung-Woo | - |
dc.contributor.author | Chung, Jin Taek | - |
dc.date.accessioned | 2021-09-07T16:21:38Z | - |
dc.date.available | 2021-09-07T16:21:38Z | - |
dc.date.created | 2021-06-14 | - |
dc.date.issued | 2011-01 | - |
dc.identifier.issn | 2156-3950 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/113308 | - |
dc.description.abstract | A piezo-actuated display package (PADP) with deformable mirror arrays is proposed for handheld applications of a micro-beam projection display. Temperature change is a critical factor affecting the performance of a PADP. To analyze temperature-related malfunctions, electrical, mechanical, and thermal analyses of the package are conducted simultaneously. A temperature control system using a micro-heater is developed to maintain the deformable mirror module at a constant temperature. Numerical results are used to determine the relationship between displacement and the temperature of the deformable mirrors. Experimental results are used to elucidate the relationship between the source image data and the temperature of the deformable mirror module. A micro-beam projector with a temperature control system is used to produce high quality images under various ambient temperatures. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Investigation of the Cause of a Malfunction in a Display Package and Its Solution | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Hwang, Sung Woo | - |
dc.contributor.affiliatedAuthor | Ju, Byeong-Kwon | - |
dc.contributor.affiliatedAuthor | Chung, Jin Taek | - |
dc.identifier.doi | 10.1109/TCPMT.2010.2099910 | - |
dc.identifier.scopusid | 2-s2.0-84876943997 | - |
dc.identifier.wosid | 000292778000015 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.1, no.1, pp.119 - 124 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | - |
dc.citation.title | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | - |
dc.citation.volume | 1 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 119 | - |
dc.citation.endPage | 124 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Engineering, Manufacturing | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.subject.keywordAuthor | Deformable mirror arrays | - |
dc.subject.keywordAuthor | micro-beam projector | - |
dc.subject.keywordAuthor | temperature control | - |
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