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Transport Characterization of Chemically-Functionalized Single-Walled Carbon Nanotube Thin Film Transistor

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dc.contributor.authorLee, Jung-Ah-
dc.contributor.authorPaek, Kyeong-Kap-
dc.contributor.authorLee, Sangyoup-
dc.contributor.authorJu, Byeong-Kwon-
dc.contributor.authorLee, Yun-Hi-
dc.contributor.authorShin, Hyun Joon-
dc.date.accessioned2021-09-07T21:31:25Z-
dc.date.available2021-09-07T21:31:25Z-
dc.date.created2021-06-14-
dc.date.issued2011-
dc.identifier.issn0013-4651-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/114953-
dc.description.abstractThe electronic transport properties of the thin film transistor (TFT) devices consisting of carboxyl-modified single-walled carbon nanotube (c-SWCNT) network are studied. This work is focused on the analysis of the effect of chemical treatment on the electronic transport properties from these devices. The c-SWCNT thin film transistor (c-SWCNT TFT) devices were fabricated by a directed assembly method based on electrostatic interaction between amino-functionalized substrate and c-SWCNTs. The electrical characteristics of c-SWCNT TFTs were measured at room temperature. From the Raman results and the transport characteristics of c-SWCNT TFT devices, the transport mechanism in these devices can be accounted that the deep levels arising from vacancy-adatom complex induced the changes in the electronic band structure of SWCNTs. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3610343] All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELECTROCHEMICAL SOC INC-
dc.subjectFIELD-EFFECT TRANSISTORS-
dc.subjectRAMAN-SPECTROSCOPY-
dc.subjectELECTRICAL-TRANSPORT-
dc.subjectCHARGE-TRANSFER-
dc.subjectTRANSPARENT-
dc.subjectACID-
dc.subjectDEVICES-
dc.subjectSENSORS-
dc.subjectFABRICATION-
dc.subjectADSORPTION-
dc.titleTransport Characterization of Chemically-Functionalized Single-Walled Carbon Nanotube Thin Film Transistor-
dc.typeArticle-
dc.contributor.affiliatedAuthorJu, Byeong-Kwon-
dc.contributor.affiliatedAuthorLee, Yun-Hi-
dc.identifier.doi10.1149/1.3610343-
dc.identifier.scopusid2-s2.0-79960920721-
dc.identifier.wosid000293175600073-
dc.identifier.bibliographicCitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.9, pp.K175 - K182-
dc.relation.isPartOfJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.titleJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.volume158-
dc.citation.number9-
dc.citation.startPageK175-
dc.citation.endPageK182-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusRAMAN-SPECTROSCOPY-
dc.subject.keywordPlusELECTRICAL-TRANSPORT-
dc.subject.keywordPlusCHARGE-TRANSFER-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusACID-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusSENSORS-
dc.subject.keywordPlusFABRICATION-
dc.subject.keywordPlusADSORPTION-
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