Surface texturing of GaAs using a nanosphere lithography technique for solar cell applications
DC Field | Value | Language |
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dc.contributor.author | Kim, B. | - |
dc.contributor.author | Bang, J. | - |
dc.contributor.author | Jang, S. | - |
dc.contributor.author | Kim, D. | - |
dc.contributor.author | Kim, J. | - |
dc.date.accessioned | 2021-09-08T00:21:23Z | - |
dc.date.available | 2021-09-08T00:21:23Z | - |
dc.date.issued | 2010-09-01 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.issn | 1879-2731 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/115716 | - |
dc.description.abstract | In this study, we present novel methods to texture the surface of GaAs substrates using the nanosphere lithography (NSL) technique that is based on arrays of SiO2 nanospheres. Closed-packed arrays of SiO2 nanospheres were formed on a benzocyclobutene (BCB) layer, followed by embedding SiO2 nanospheres into the BCB layer. To texture the GaAs surface, three patterns were fabricated by nanosphere lithography. First, a convex pattern from the shape of the nanospheres was produced on the surface of GaAs. Second, a concave shape was produced on the surface of GaAs by additional wet etching to remove SiO2 nanospheres. These two methods were found to be effective in reducing the reflectance to a range of 400-800 nm. Finally, the arrays of SiO2 nanospheres were transferred onto the GaAs by dry-etching using a mixture of Cl-2 and BCl3 gases, resulting in arrays of GaAs nanorods. The dry-etched surface structure showed the lowest reflectance. (C) 2010 Elsevier B.V. All rights reserved. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Surface texturing of GaAs using a nanosphere lithography technique for solar cell applications | - |
dc.type | Article | - |
dc.publisher.location | 스위스 | - |
dc.identifier.doi | 10.1016/j.tsf.2010.03.165 | - |
dc.identifier.wosid | 000282242600097 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.518, no.22, pp 6583 - 6586 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 518 | - |
dc.citation.number | 22 | - |
dc.citation.startPage | 6583 | - |
dc.citation.endPage | 6586 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | MULTICRYSTALLINE SILICON | - |
dc.subject.keywordAuthor | Solar cells | - |
dc.subject.keywordAuthor | Anti-reflection | - |
dc.subject.keywordAuthor | Surface texturing | - |
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