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Quantitative measurements of absolute dielectrophoretic forces using optical tweezers

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dc.contributor.authorHong, Yoochan-
dc.contributor.authorPyo, Jin-Woo-
dc.contributor.authorBaek, Sang Hyun-
dc.contributor.authorLee, Sang Woo-
dc.contributor.authorYoon, Dae Sung-
dc.contributor.authorNo, Kwangsoo-
dc.contributor.authorKim, Beop-Min-
dc.date.accessioned2021-09-08T01:30:26Z-
dc.date.available2021-09-08T01:30:26Z-
dc.date.created2021-06-11-
dc.date.issued2010-07-15-
dc.identifier.issn0146-9592-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/116052-
dc.description.abstractOptical tweezers were used for quantitative measurement of the absolute dielectrophoresis (DEP) forces acting on polystyrene microparticles. The electrodes and tweezers were configured to create one-dimensional DEP forces acting perpendicular to the tweezers' beam. The influences of various external factors, such as applied voltage frequency, conductivity of the medium, and particle size on the measurement were estimated. By accounting for these factors, actual measurements were in close agreement with theoretical predictions. Our results show that the optical tweezers may serve as a unique tool for the measurement of DEP forces in various applications. (C) 2010 Optical Society of America-
dc.languageEnglish-
dc.language.isoen-
dc.publisherOPTICAL SOC AMER-
dc.subjectELECTRIC-FIELD-
dc.titleQuantitative measurements of absolute dielectrophoretic forces using optical tweezers-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Beop-Min-
dc.identifier.doi10.1364/OL.35.002493-
dc.identifier.scopusid2-s2.0-77954967151-
dc.identifier.wosid000279994400060-
dc.identifier.bibliographicCitationOPTICS LETTERS, v.35, no.14, pp.2493 - 2495-
dc.relation.isPartOfOPTICS LETTERS-
dc.citation.titleOPTICS LETTERS-
dc.citation.volume35-
dc.citation.number14-
dc.citation.startPage2493-
dc.citation.endPage2495-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaOptics-
dc.relation.journalWebOfScienceCategoryOptics-
dc.subject.keywordPlusELECTRIC-FIELD-
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