One-class classification-based control charts for multivariate process monitoring

Abstract

One-class classification problems have attracted a great deal of attention from various disciplines. In the present study, attempts are made to extend the scope of application of the one-class classification technique to Statistical Process Control (SPC) problems. New multivariate control charts that apply the effectiveness of one-class classification to improvement of Phase I and Phase II analysis in SPC are proposed. These charts use a monitoring statistic to represent the degree of being an outlier as obtained through one-class classification. The control limits of the proposed charts are established based on the empirical level of significance on the percentile, estimated by the bootstrap method. A simulation study is conducted to illustrate the limitations of current one-class classification control charts and demonstrate the effectiveness of the proposed control charts.