Live Cell Refractometry Using Hilbert Phase Microscopy and Confocal Reflectance Microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lue, Niyom | - |
dc.contributor.author | Choi, Wonshik | - |
dc.contributor.author | Popescu, Gabriel | - |
dc.contributor.author | Yaqoob, Zahid | - |
dc.contributor.author | Badizadegan, Kamran | - |
dc.contributor.author | Dasari, Ramachandra R. | - |
dc.contributor.author | Feld, Michael S. | - |
dc.date.accessioned | 2021-09-08T11:27:40Z | - |
dc.date.available | 2021-09-08T11:27:40Z | - |
dc.date.created | 2021-06-11 | - |
dc.date.issued | 2009-11-26 | - |
dc.identifier.issn | 1089-5639 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/118899 | - |
dc.description.abstract | Quantitative chemical analysis has served as a useful tool for understanding cellular metabolisms in biology. Among many physical properties used in chemical analysis, refractive index in particular has provided molecular concentration that is an important indicator for biological activities. In this report, we present a method of extracting full-field refractive index maps of live cells in their native states. We first record full-field optical thickness maps of living cells by Hilbert phase microscopy and then acquire physical thickness maps of the same cells using a custom-built confocal reflectance microscope. Full-field and axially averaged refractive index maps are acquired from the ratio of optical thickness to physical thickness. The accuracy of the axially averaged index measurement is 0.002. This approach can provide novel biological assays of label-free living cells in situ. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | REFRACTIVE-INDEX MEASUREMENT | - |
dc.subject | MORPHOMETRY | - |
dc.subject | DYNAMICS | - |
dc.subject | CONTRAST | - |
dc.title | Live Cell Refractometry Using Hilbert Phase Microscopy and Confocal Reflectance Microscopy | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, Wonshik | - |
dc.identifier.doi | 10.1021/jp904746r | - |
dc.identifier.scopusid | 2-s2.0-72949083591 | - |
dc.identifier.wosid | 000271825800030 | - |
dc.identifier.bibliographicCitation | JOURNAL OF PHYSICAL CHEMISTRY A, v.113, no.47, pp.13327 - 13330 | - |
dc.relation.isPartOf | JOURNAL OF PHYSICAL CHEMISTRY A | - |
dc.citation.title | JOURNAL OF PHYSICAL CHEMISTRY A | - |
dc.citation.volume | 113 | - |
dc.citation.number | 47 | - |
dc.citation.startPage | 13327 | - |
dc.citation.endPage | 13330 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Physics, Atomic, Molecular & Chemical | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX MEASUREMENT | - |
dc.subject.keywordPlus | MORPHOMETRY | - |
dc.subject.keywordPlus | DYNAMICS | - |
dc.subject.keywordPlus | CONTRAST | - |
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