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Grain-Boundary Conduction in Gadolinia-Doped Ceria: The Effect of SrO Addition

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dc.contributor.authorCho, Pyeong-Seok-
dc.contributor.authorCho, Yoon Ho-
dc.contributor.authorPark, Seung-Young-
dc.contributor.authorLee, Sung Bo-
dc.contributor.authorKim, Doh-Yeon-
dc.contributor.authorPark, Hyun-Min-
dc.contributor.authorAuchterlonie, Graeme-
dc.contributor.authorDrennan, John-
dc.contributor.authorLee, Jong-Heun-
dc.date.accessioned2021-09-09T01:14:30Z-
dc.date.available2021-09-09T01:14:30Z-
dc.date.created2021-06-10-
dc.date.issued2009-
dc.identifier.issn0013-4651-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/122168-
dc.description.abstractThis study examined the effect of adding SrO on the grain-boundary conduction of Ce0.9Gd0.1O1.95 (gadolinia-doped ceria) containing 500 ppm SiO2. The apparent grain-boundary resistivity at 300 degrees C decreased drastically from 746.7 to 0.90-1.97 k Omega cm upon doping with >= 1 mol % SrO, while the grain-interior resistivity increased gradually from 3.1 to 11.6 k Omega cm as the SrO concentration was increased up to 5 mol %. Therefore, doping with 1 mol % SrO resulted in the minimum total resistivity. The electron probe X-ray microanalysis and the analysis of the lattice parameters suggest that the 140-500-fold enhancement in the grain-boundary conduction is attributed to the scavenging of the highly resistive siliceous phase by the SrO-containing phase. (C) 2008 The Electrochemical Society.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELECTROCHEMICAL SOC INC-
dc.subjectELECTRICAL-PROPERTIES-
dc.subjectSTABILIZED ZIRCONIA-
dc.subjectIONIC-CONDUCTIVITY-
dc.subjectTRIVALENT CATIONS-
dc.subjectALUMINA ADDITIONS-
dc.subjectMICROSTRUCTURE-
dc.subjectELECTROLYTES-
dc.subjectENHANCEMENT-
dc.subjectIMPROVEMENT-
dc.subjectMITIGATION-
dc.titleGrain-Boundary Conduction in Gadolinia-Doped Ceria: The Effect of SrO Addition-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Jong-Heun-
dc.identifier.doi10.1149/1.3046153-
dc.identifier.scopusid2-s2.0-59349115939-
dc.identifier.wosid000265837900023-
dc.identifier.bibliographicCitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.156, no.3, pp.B339 - B344-
dc.relation.isPartOfJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.titleJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.volume156-
dc.citation.number3-
dc.citation.startPageB339-
dc.citation.endPageB344-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusSTABILIZED ZIRCONIA-
dc.subject.keywordPlusIONIC-CONDUCTIVITY-
dc.subject.keywordPlusTRIVALENT CATIONS-
dc.subject.keywordPlusALUMINA ADDITIONS-
dc.subject.keywordPlusMICROSTRUCTURE-
dc.subject.keywordPlusELECTROLYTES-
dc.subject.keywordPlusENHANCEMENT-
dc.subject.keywordPlusIMPROVEMENT-
dc.subject.keywordPlusMITIGATION-
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