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Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Hyun Seok | - |
| dc.contributor.author | Lee, Taek Sung | - |
| dc.contributor.author | Lee, Yongwoon | - |
| dc.contributor.author | Kim, Jooho | - |
| dc.contributor.author | Lee, Suyoun | - |
| dc.contributor.author | Huh, Joo-Youl | - |
| dc.contributor.author | Kim, Donghwan | - |
| dc.contributor.author | Cheong, Byung-ki | - |
| dc.date.accessioned | 2021-09-09T01:52:20Z | - |
| dc.date.available | 2021-09-09T01:52:20Z | - |
| dc.date.created | 2021-06-10 | - |
| dc.date.issued | 2008-12-01 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/122244 | - |
| dc.description.abstract | Superresolution (SR) phenomena due to Ge2Sb2Te5 films were examined by combined analysis of the transmission electron microscopy (TEM) microstructures of the laser-irradiated films and the results from dynamic and static tests using blue lasers. A new finding was made that comprises a complementary case of the classical SR readout by Ge2Sb2Te5 film; an amorphous band instead of a closed aperture of melt in the crystalline background forms behind a moving laser but still produces a high SR signal. A complete carrier-to-noise-ratio curve of a SR-read-only memory employing Ge2Sb2Te5 may be derived from a nonlinear optical effect, specifically thermally assisted saturable absorption. | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.subject | NEAR-FIELD STRUCTURE | - |
| dc.subject | DISK | - |
| dc.subject | RESOLUTION | - |
| dc.subject | MEMORY | - |
| dc.title | Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Huh, Joo-Youl | - |
| dc.contributor.affiliatedAuthor | Kim, Donghwan | - |
| dc.identifier.doi | 10.1063/1.3040695 | - |
| dc.identifier.scopusid | 2-s2.0-57349112347 | - |
| dc.identifier.wosid | 000261430600008 | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.93, no.22 | - |
| dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 93 | - |
| dc.citation.number | 22 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | NEAR-FIELD STRUCTURE | - |
| dc.subject.keywordPlus | DISK | - |
| dc.subject.keywordPlus | RESOLUTION | - |
| dc.subject.keywordPlus | MEMORY | - |
| dc.subject.keywordAuthor | antimony alloys | - |
| dc.subject.keywordAuthor | germanium alloys | - |
| dc.subject.keywordAuthor | laser beam effects | - |
| dc.subject.keywordAuthor | optical saturation | - |
| dc.subject.keywordAuthor | tellurium alloys | - |
| dc.subject.keywordAuthor | thin films | - |
| dc.subject.keywordAuthor | transmission electron microscopy | - |
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