Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films

Full metadata record
DC Field Value Language
dc.contributor.authorYoon, Jungbum-
dc.contributor.authorPark, Seung-Young-
dc.contributor.authorJo, Younghun-
dc.contributor.authorJung, Myung-Hwa-
dc.contributor.authorYou, Chun-Yeol-
dc.contributor.authorKim, Taewan-
dc.contributor.authorHwang, Jae Youn-
dc.contributor.authorYim, Hae In-
dc.contributor.authorRhee, Jang Roh-
dc.contributor.authorChun, Byong Sun-
dc.contributor.authorKim, You Song-
dc.contributor.authorKim, Young Keun-
dc.date.accessioned2021-09-09T06:20:52Z-
dc.date.available2021-09-09T06:20:52Z-
dc.date.created2021-06-10-
dc.date.issued2008-07-
dc.identifier.issn1536-125X-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/123072-
dc.description.abstractThis study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co(74) Fe(14) Si(14) B(8) and nanocrystalline Co(78) Fe(2) Si(12) B(8) thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectFREE LAYERS-
dc.titleStructural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Young Keun-
dc.identifier.doi10.1109/TNANO.2008.926334-
dc.identifier.wosid000258766300004-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON NANOTECHNOLOGY, v.7, no.4, pp.409 - 411-
dc.relation.isPartOfIEEE TRANSACTIONS ON NANOTECHNOLOGY-
dc.citation.titleIEEE TRANSACTIONS ON NANOTECHNOLOGY-
dc.citation.volume7-
dc.citation.number4-
dc.citation.startPage409-
dc.citation.endPage411-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusFREE LAYERS-
dc.subject.keywordAuthoramorphous-
dc.subject.keywordAuthorantiferromagnetic exchange coupling-
dc.subject.keywordAuthornanocrystalline CoFeSiB thin film-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Young Keun photo

Kim, Young Keun
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE