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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

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dc.contributor.authorAdam, A. J. L.-
dc.contributor.authorBrok, J. M.-
dc.contributor.authorSeo, M. A.-
dc.contributor.authorAhn, K. J.-
dc.contributor.authorKim, D. S.-
dc.contributor.authorKang, J. H.-
dc.contributor.authorPark, Q. H.-
dc.contributor.authorNagel, M.-
dc.contributor.authorPlanken, P. C. M.-
dc.date.accessioned2021-09-09T08:13:01Z-
dc.date.available2021-09-09T08:13:01Z-
dc.date.issued2008-05-26-
dc.identifier.issn1094-4087-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/123520-
dc.description.abstractAn erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work. (c) 2008 Optical Society of America.-
dc.format.extent1-
dc.language영어-
dc.language.isoENG-
dc.publisherOPTICAL SOC AMER-
dc.titleAdvanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1364/OE.16.008054-
dc.identifier.scopusid2-s2.0-44649121494-
dc.identifier.wosid000256469900052-
dc.identifier.bibliographicCitationOPTICS EXPRESS, v.16, no.11, pp 8054 - 8054-
dc.citation.titleOPTICS EXPRESS-
dc.citation.volume16-
dc.citation.number11-
dc.citation.startPage8054-
dc.citation.endPage8054-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaOptics-
dc.relation.journalWebOfScienceCategoryOptics-
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