Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Adam, A. J. L. | - |
dc.contributor.author | Brok, J. M. | - |
dc.contributor.author | Seo, M. A. | - |
dc.contributor.author | Ahn, K. J. | - |
dc.contributor.author | Kim, D. S. | - |
dc.contributor.author | Kang, J. H. | - |
dc.contributor.author | Park, Q. H. | - |
dc.contributor.author | Nagel, M. | - |
dc.contributor.author | Planken, P. C. M. | - |
dc.date.accessioned | 2021-09-09T08:31:10Z | - |
dc.date.available | 2021-09-09T08:31:10Z | - |
dc.date.created | 2021-06-10 | - |
dc.date.issued | 2008-05-12 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/123544 | - |
dc.description.abstract | Using terahertz-light excitation, we have measured with sub-wavelength spatial, and sub-cycle temporal resolution the time- and frequency-dependent electric-field and surface-charge density in the vicinity of small metallic holes. In addition to a singularity like concentration of the electric field near the hole edges, we observe, that holes can act as differential operators whose near-field output is the time-derivative of the incident electric field. Our results confirm the well-known predictions made by Bouwkamp, Philips Res. Rep. 5, 321-332 (1950), and reveal, with unprecedented detail, what physically happens when light passes through a small hole. (C) 2008 Optical Society of America. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.subject | OPTICAL-TRANSMISSION | - |
dc.subject | HOLE | - |
dc.subject | DIFFRACTION | - |
dc.subject | MICROSCOPY | - |
dc.subject | PROBES | - |
dc.subject | LIGHT | - |
dc.title | Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Q. H. | - |
dc.identifier.doi | 10.1364/OE.16.007407 | - |
dc.identifier.scopusid | 2-s2.0-43849083227 | - |
dc.identifier.wosid | 000256469800066 | - |
dc.identifier.bibliographicCitation | OPTICS EXPRESS, v.16, no.10, pp.7407 - 7417 | - |
dc.relation.isPartOf | OPTICS EXPRESS | - |
dc.citation.title | OPTICS EXPRESS | - |
dc.citation.volume | 16 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 7407 | - |
dc.citation.endPage | 7417 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.subject.keywordPlus | OPTICAL-TRANSMISSION | - |
dc.subject.keywordPlus | HOLE | - |
dc.subject.keywordPlus | DIFFRACTION | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | PROBES | - |
dc.subject.keywordPlus | LIGHT | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.