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InAs/GaAs quantum-dot laser diode lasing at 1.3 mu m with triple-stacked-layer dots-in-a-well structure grown by atomic layer epitaxy

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dc.contributor.authorKim, Kwang Woong-
dc.contributor.authorCho, Nam Ki-
dc.contributor.authorRyu, Sung Phil-
dc.contributor.authorSong, Jin Dong-
dc.contributor.authorChoi, Won Jun-
dc.contributor.authorLee, Jung Il-
dc.contributor.authorPark, Jung Ho-
dc.date.accessioned2021-09-09T17:51:11Z-
dc.date.available2021-09-09T17:51:11Z-
dc.date.created2021-06-17-
dc.date.issued2006-10-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/125927-
dc.description.abstractWe report the first demonstration of room-temperature (RT) lasing at 1.3 mu m from the ground state of three-stacked InAs quantum dots (QDs) in an In0.15Ga0.85As quantum well, which was grown by atomic layer epitaxy (ALE). For an as-cleaved device with a 2000-mu m-long x 15-mu m-wide ridge structure, the threshold current density (J(th)) at RT is 155 A/cm(2) with the ground state lasing at 1310nm under pulsed operation. The thermal coefficient of a lasing wavelength shift is 0.53 nm/K and the characteristic temperature is 103 K near RT. The lasing wavelength of the QD laser diodes (LDs) shows simultaneous lasing and the state switching from the ground state at 1310nm and to the first excited state at 1232nm kith increasing injection current owing to the gain saturation of the ground state. The performance of ALE QD-LD is comparable to that of the conventional Stranski-Krastanov QD-LD.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherJAPAN SOC APPLIED PHYSICS-
dc.subjectROOM-TEMPERATURE-
dc.subjectTHRESHOLD CURRENT-
dc.subjectSPACER LAYER-
dc.subjectDEPENDENCE-
dc.titleInAs/GaAs quantum-dot laser diode lasing at 1.3 mu m with triple-stacked-layer dots-in-a-well structure grown by atomic layer epitaxy-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Jung Ho-
dc.identifier.doi10.1143/JJAP.45.8010-
dc.identifier.scopusid2-s2.0-34250013320-
dc.identifier.wosid000241508600086-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.10A, pp.8010 - 8013-
dc.relation.isPartOfJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS-
dc.citation.volume45-
dc.citation.number10A-
dc.citation.startPage8010-
dc.citation.endPage8013-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusTHRESHOLD CURRENT-
dc.subject.keywordPlusSPACER LAYER-
dc.subject.keywordPlusDEPENDENCE-
dc.subject.keywordAuthorInAs/GaAs quantum dot-
dc.subject.keywordAuthorlaser diode-
dc.subject.keywordAuthoratomic layer epitaxy-
dc.subject.keywordAuthorsimultaneous lasing-
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