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MC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural Networks

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dc.contributor.authorJun-Geol Baek-
dc.date.accessioned2021-09-14T13:14:35Z-
dc.date.available2021-09-14T13:14:35Z-
dc.date.created2021-09-14-
dc.date.issued2021-07-21-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/126773-
dc.publisherKSPE-
dc.titleMC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural Networks-
dc.title.alternativeMC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural Networks-
dc.typeConference-
dc.contributor.affiliatedAuthorJun-Geol Baek-
dc.identifier.bibliographicCitationInternational Symposium on Precision Engineering and Sustainable Manufacturing (PRESM 2021)-
dc.relation.isPartOfInternational Symposium on Precision Engineering and Sustainable Manufacturing (PRESM 2021)-
dc.relation.isPartOfPRESM 2021-
dc.citation.titleInternational Symposium on Precision Engineering and Sustainable Manufacturing (PRESM 2021)-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlaceJeju, Korea-
dc.citation.conferenceDate2021-07-21-
dc.type.rimsCONF-
dc.description.journalClass2-
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